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ntmdt-si.ru was registered 8 years 2 months ago. It has a alexa rank of #1,931,259 in the world. It is a domain having .ru extension. It is estimated worth of $ 720.00 and have a daily income of around $ 3.00. As no active threats were reported recently, ntmdt-si.ru is SAFE to browse.
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Отправить. Принять политику конфиденциальности. Сканирующая зондовая микроскопия и спектроскопия. +1-480-493-0093. [email protected].
NT-MDT Spectrum Instruments: Leading the Way in Nanoscale Analysis. High- End AFM ... In the new form, NT-MDT's businesses are represented by companies in Russia, Europe, USA ...
All rights reserved. Keywords: Nano-oxidation; Atomic force microscopy; Nanolithography; Silicon; Wear. 1. Introduction. Scanning probe ...
18 Apr 2005 ... Si) and hydrophobic (graphite) substrates were investigated. The spatial structure ... made with a home-built AFM interfaced with NT-MDT con-.
carried out using NT-MDT's solver-P47H ambient based multimode atomic force microscope. ... A silicon cantilever having typical radius of curvature of 10 nm, ...
23 Feb 2008 ... A commercial AFM (Smena-B, NT-MDT, Russia) and a rectangular silicon probe ( NSC15, MikroMasch, Russia) were used to scratch the resist ...
Hence, the. Y.H. Guu / Applied Surface Science 242 (2005) 245–250. 246. Table 1. Chemical composition of the AISI D2 tool steel (wt.%). Element. C. Si. Mn. Mo.
SiO and Si. 2. Gas. Methane. Pressure (Pa). 25. RF generator frequency (MHz). 13.56. RF generator power (kW). 6. Negative self-bias voltage of RF. 180, 240,.
Field emission scanning electron microscopy (FESEM) further confirms the a- and b-axis orientation in ZnO films on Si substrate with hexagonal columnar like ...
clock. Always Open. BUSINESS INFO. Founded on July 29, 1991. CONTACT INFO. Call +7 499 110-20-50. [email protected] · http://www.ntmdt-si.com. @ NTMDT.
using atomic force microscopy (AFM, NT-MDT ... the PZT (65/35) films on Pt/Si substrates without ... Pt/Si (1 1 1) with a PT seed layer, by sol-gel showed.
3 Mar 2006 ... [28] C.B. Schaffer, A. Brodeur, J.F. Garcia, E. Mazur, Opt. Lett. 26 (2001). 93. [29] J. Qiu, P.G. Kazansky, J. Si, K. Miura, T. Mitsuyu, K. Hirao, A.L..
SiO2/Si substrates. Figure 4b ... in a NT-MDT confocal Raman microscopic system (laser wave- ... 300 nm silicon oxide layer by the dip-coating method, followed.
The latest Tweets from NT-MDT S.I. (@NTMDT). The official Twitter account of NT -MDT Spectrum Instruments. SPM, AFM, STM, AFM Probes, Confocal Raman, ...
NT-MDT S.I. is happy to present a new group of AFM and AFM-Optical combined modes based on fast ... The conference took place this year at TU Dresden.
The presence of interstitial oxygen and oxygen bonded in surface Si–. OH groups was ... the atomic force microscope NT–MDT SPM Solver. P7 LS measuring in ...
8 Mar 2018 ... www.ntmdt-si.ru/. 11. C. M. Lin, W. C. Lien, V. V. Felmetsger, M. A. Hopcroft, D. G. Senesky, and A. P. Pisano, Appl. Phys. Lett. 97, 141907 ...
NT-MDT S.I.. Карточка организации. Телефон: +7 (499) 110-2050. Факс: +7 ( 499) 110-2070. E-mail: [email protected]. Направление: Оборудование.
代表者への連絡先 小冊子の作成 https://www.ntmdt-si.ru. NT-MDTは、2人の博士号 取得者と8人の理系候補生を含む53人の優秀な専門家を雇用しています。会社の ...
[email protected] · [email protected]. По данным ЕГРЮЛ организация ООО "НТ-МДТ" зарегистрирована 8 мая 2013 по адресу 124460, Москва, проезд ...
H1 Headings: | 1 | H2 Headings: | 1 |
H3 Headings: | 5 | H4 Headings: | Not Applicable |
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Total IFRAMEs: | 1 | Total Images: | 28 |
Google Adsense: | Not Applicable | Google Analytics: | Not Applicable |
Words | Occurrences | Density | Possible Spam |
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НТМДТ Спектрум | 4 | 5.556 % | No |
Спектрум Инструментс | 4 | 5.556 % | No |
в области | 3 | 4.167 % | No |
Спектра II | 3 | 4.167 % | No |
ИНТЕГРА Спектра | 3 | 4.167 % | No |
Галерея сканов | 3 | 4.167 % | No |
НАНОЭДЬЮКАТОР II | 2 | 2.778 % | No |
II СОЛВЕР | 2 | 2.778 % | No |
НЕКСТ II | 2 | 2.778 % | No |
технической поддержки | 2 | 2.778 % | No |
научных исследований | 2 | 2.778 % | No |
для научных | 2 | 2.778 % | No |
исследований ИНТЕГРА | 2 | 2.778 % | No |
компаний НТМДТ | 2 | 2.778 % | No |
для нанотехнологий | 2 | 2.778 % | No |
Сканирующая зондовая | 2 | 2.778 % | No |
О компании | 2 | 2.778 % | No |
и спектроскопия | 2 | 2.778 % | No |
Нано ИК | 2 | 2.778 % | No |
микроскопия и | 2 | 2.778 % | No |
Words | Occurrences | Density | Possible Spam |
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Conference December 811 2020 | 1 | 1.389 % | No |
SNAIA2020 Conference December 811 | 1 | 1.389 % | No |
December 811 2020 Invitation | 1 | 1.389 % | No |
811 2020 Invitation to | 1 | 1.389 % | No |
Invitation to 2020 Virtual | 1 | 1.389 % | No |
2020 Invitation to 2020 | 1 | 1.389 % | No |
at SNAIA2020 Conference December | 1 | 1.389 % | No |
Abstract at SNAIA2020 Conference | 1 | 1.389 % | No |
Last Сhance to Submit | 1 | 1.389 % | No |
События Last Сhance to | 1 | 1.389 % | No |
Сhance to Submit Your | 1 | 1.389 % | No |
to Submit Your Abstract | 1 | 1.389 % | No |
Your Abstract at SNAIA2020 | 1 | 1.389 % | No |
Submit Your Abstract at | 1 | 1.389 % | No |
to 2020 Virtual MRS | 1 | 1.389 % | No |
2020 Virtual MRS Fall | 1 | 1.389 % | No |
4 2020 Все события | 1 | 1.389 % | No |
December 4 2020 Все | 1 | 1.389 % | No |
2020 Все события Принципы | 1 | 1.389 % | No |
Все события Принципы SPM | 1 | 1.389 % | No |
Domain Registrar: | RU-CENTER-REG-RIPN |
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Registration Date: | 2016-09-02 8 years 2 months 2 weeks ago |
Expiration Date: | 2021-09-02 3 years 2 months 2 weeks ago |
Host | IP Address | Country | |
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ns.ntmdt.ie | 62.77.166.234 | Ireland | |
ns.ntmdt.ru | 81.94.134.74 | Russia | |
ns.ntmdt.us | 24.250.101.34 | United States |
Host | Type | TTL | Extra |
---|---|---|---|
ntmdt-si.ru | A | 86328 |
IP: 79.174.67.107 |
ntmdt-si.ru | NS | 86400 |
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ntmdt-si.ru | NS | 86400 |
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ntmdt-si.ru | NS | 86400 |
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ntmdt-si.ru | MX | 86400 |
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ntmdt-si.ru | MX | 86400 |
Priority: 5 Target: mail0.ntmdt-si.com |
ntmdt-si.ru | TXT | 86400 |
TXT: v=spf1 +mx +a:pride.ntmdt-si.com -all |
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